Very-fast transmission line pulsing of integrated structures and the charged device model

Publisher Website

1 January 1996

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 85-94
https://doi.org/10.1109/eosesd.1996.865129

Abstract

No abstract available

This publication has 3 references indexed in Scilit:

Influence of tester, test method, and device type on CDM ESD testing
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A, 1995
A correlation study between different types of CDM testers and "real" manufacturing in-line leakage failures
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A, 1995
A CDM‐only reproducible field degradation and its reliability aspect
Quality and Reliability Engineering International, 1994