ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth

This publication has 14 references indexed in Scilit:

• Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions: Effects of the molecular structure and the ion beam induced surface degradation
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1995
• Assembly of Multicomponent Protein Films by Means of Electrostatic Layer-by-Layer Adsorption
  Journal of the American Chemical Society, 1995
• Internal structure of layer-by-layer adsorbed polyelectrolyte films: a neutron and x-ray reflectivity study
  Macromolecules, 1993
• Quantitative XPS. Part II: Comparison between different quantitative approaches for two different spectrometers?determination of the contamination-reduced thickness, application of the determined transmission functions and accuracy achieved
  Surface and Interface Analysis, 1993
• Quantitative XPS. Part I: Experimental determination of the relative analyser transmission function of two different spectrometers — a critical assessment of various methods, parameters involved and errors introduced
  Surface and Interface Analysis, 1993
• Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
  Journal of Physics D: Applied Physics, 1992
• Buildup of ultrathin multilayer films by a self-assembly process: III. Consecutively alternating adsorption of anionic and cationic polyelectrolytes on charged surfaces
  Thin Solid Films, 1992
• Microscope imaging by time-of-flight secondary ion mass spectrometry
  Microscopy Microanalysis Microstructures, 1992
• X-ray and neutron scattering from rough surfaces
  Physical Review B, 1988
• Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988