Quantitative XPS. Part I: Experimental determination of the relative analyser transmission function of two different spectrometers — a critical assessment of various methods, parameters involved and errors introduced
- 1 March 1993
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 20 (3) , 179-192
- https://doi.org/10.1002/sia.740200302
Abstract
The relative analyser transmission functions of two different XPS spectrometers (VG ESCA‐3 Mk II and SSI X‐Probe of Fisons) have been determined experimentally by several methods presented in the literature. The transmission function of the VG ESCA‐3 Mk II can be expressed as T ∝ Ea(Ea/Ek)n, where n is close to 0.8. The transmission function T of the SSI X‐Probe cannot be presented as a separate function of Ea and Ek and it is expressed as The possible influence of the efficiency D of the detector on the determined transmission functions is discussed. The advantages and disadvantages of the methods used are pointed out, together with their limitations and potential applications. The results show that some methods can only be applied to spectrometers such as the VG ESCA‐3 Mk II in which n is a constant or depends only on Ek. The method proposed by Hemminger et al. [Surf. Interface Anal. 15, 323 (1990)] has been shown to be applicable to both spectrometers but a systematic error can be introduced when D is not constant. Such a systematic error can be reduced by another method but this method can only be applied to spectrometers in which the transmission function is known for a given analyser energy.Keywords
This publication has 39 references indexed in Scilit:
- Quantitative AES and XPS: Determination of the electron spectrometer transmission function and the detector sensitivity energy dependencies for the production of true electron emission spectra in AES and XPSSurface and Interface Analysis, 1990
- Precision, accuracy, and uncertainty in quantitative surface analyses by Auger-electron spectroscopy and x-ray photoelectron spectroscopyJournal of Vacuum Science & Technology A, 1990
- Quantitative AES and XPS: calibration of electron spectrometers for true spectral measurements—VAMAS round robins and parameters for reference spectral data banksVacuum, 1990
- Electron trajectory analysis of the spherical-sector electrostatic spectrometer: focussing properties and multichannel detection capabilityJournal of Electron Spectroscopy and Related Phenomena, 1989
- Methods for quantitative analysis in XPS and AESSurface and Interface Analysis, 1989
- A generalized analytic approach for the determination of transmission functions of charged-particle energy analyzersNuclear Instruments and Methods in Physics Research, 1982
- An experimental and theoretical study of the transmission function of a commercial hemispherical electron energy analyserSurface and Interface Analysis, 1982
- Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysisSurface and Interface Analysis, 1981
- Sensitivity factors, cross-section and resolution data for use with the Si Kα X-ray sourceJournal of Electron Spectroscopy and Related Phenomena, 1980
- The quantitative analysis of surfaces by XPS: A reviewSurface and Interface Analysis, 1980