A parametric study of extrinsic bistability in the current-voltage curves of resonant-tunneling diodes
- 1 March 1991
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 69 (5) , 3381-3383
- https://doi.org/10.1063/1.348961
Abstract
We report numerical simulations of typical experimental conditions under which current‐voltage (I‐V) measurements of resonant‐tunneling diodes are conducted. We find that curve tracer measurements can cause bistability and hysteresis in the negative differential resistance (NDR) region. We also find that dc measurements can produce oscillations which distort the shape of the I‐V curve. When the series resistance is large, there are three states for a given bias in the NDR region because of the folding of the I‐V curve. We believe this phenomenon, extrinsic tristability, to be the source of extrinsic bistability.This publication has 20 references indexed in Scilit:
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