Beam profile analysis for a 252Cf plasma-desorption time-of-flight mass spectrometer
- 1 July 1981
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 39 (2) , 157-166
- https://doi.org/10.1016/0020-7381(81)80030-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Thin film deposition by the electrospray method for californium-252 plasma desorption studies of involatile moleculesAnalytical Chemistry, 1979
- Experimental Investigation about the Mechanism of Fission-Fragment Induced DesorptionZeitschrift für Naturforschung A, 1977
- 252Cf-plasma desorption time-of-flight mass spectrometryInternational Journal of Mass Spectrometry and Ion Physics, 1976
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970