Threshold-Value Simulation and Test Generation

This publication has 5 references indexed in Scilit:

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  IEEE Transactions on Computers, 1981
• A Nine-Valued Circuit Model for Test Generation
  IEEE Transactions on Computers, 1976
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• Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits
  IEEE Transactions on Electronic Computers, 1967
• On the Necessity to Examine D-Chains in Diagnostic Test Generation—An Example [Letter to the Editor]
  IBM Journal of Research and Development, 1967