Picosecond gain and saturation measurements of the 353-nm XeF laser line
- 1 December 1977
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 31 (11) , 747-749
- https://doi.org/10.1063/1.89525
Abstract
The spectral characteristics, temporal gain profile, and saturation energy have been measured for the 353‐nm XeF laser line using a picosecond probe pulse of the third harmonic of a Nd : glass laser.Keywords
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