High resolution depth profiling of nitrogen in A1N layers
- 1 March 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 66 (1-2) , 262-266
- https://doi.org/10.1016/0168-583x(92)96161-q
Abstract
No abstract availableKeywords
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