Optical properties of silicon-nitride atomic-force microscopy tips in scanning tunneling optical microscopy: experimental study
- 1 February 1995
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 34 (4) , 703-708
- https://doi.org/10.1364/ao.34.000703
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 12 references indexed in Scilit:
- Application of Mie Scattering of Evanescent Waves to Scanning Tunnelling Optical Microscopy TheoryJournal of Modern Optics, 1993
- Resolution in collection-mode scanning optical microscopyJournal of Applied Physics, 1993
- Near-field optical microscope using a silicon-nitride probeApplied Physics Letters, 1993
- Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction LimitScience, 1992
- Scanning-tunneling optical microscopy: a theoretical macroscopic approachJournal of the Optical Society of America A, 1992
- Observation of optical waveguides by using a photon scanning tunneling microscopeJournal of Optics, 1992
- Analysis of photon scanning tunneling microscope imagesJournal of Applied Physics, 1992
- Phase-stepping microscopy (PSM): a qualification tool for electronic and optoelectronic devicesSemiconductor Science and Technology, 1992
- Sample–tip coupling efficiencies of the photon-scanning tunneling microscopeJournal of the Optical Society of America A, 1991
- General principles of scanning tunneling optical microscopyOptics Letters, 1989