An automatic system for low temperature electrical measurements on semiconductors

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Abstract
Describes a fully automatic system for measuring the resistivity and Hall coefficient of semiconductors between 5K and 300K. The specimen temperature can be stabilized within +or-0.01K for the period measurement at 50 preprogrammed temperatures, and an important feature is that the measurements are commenced only when the desired thermal stability has been achieved. This permits accurate automatic measurements on specimens with strongly temperature dependent properties. The operations are controlled by hardwired logic and the data is handled by small on-line computer.