Identification of Defect Sites on SiO2 Thin Films Grown on Mo(112)
- 12 December 2002
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 19 (2) , 354-357
- https://doi.org/10.1021/la020634e
Abstract
No abstract availableKeywords
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