Universal approach to accurate resistivity measurement for a single nanowire: Theory and application
- 18 December 2006
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 89 (25) , 253102
- https://doi.org/10.1063/1.2405400
Abstract
A universal four-contact method is proposed to accurately determine the resistivity of a single nanowire and other nanostructures. Unlike the conventional four-contact method or two-contact method, the present scheme does not require nonrectifying (Ohmic) contacts to the nanowire and can completely eliminate the systematic error resulting from the contact resistance or the resistance difference between the contacts. The present method has been applied to copper nanowire and can be used as a universal resistivity measurement scheme for all nanowires and other nanostructures.Keywords
This publication has 14 references indexed in Scilit:
- Free-space-wiring fabrication in nano-space by focused-ion-beam chemical vapor depositionJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2003
- Electrical properties of zinc oxide nanowires and intramolecular p–n junctionsApplied Physics Letters, 2003
- Single-electron tunneling in InP nanowiresApplied Physics Letters, 2003
- Electrical characterization of electrochemically grown single copper nanowiresApplied Physics Letters, 2003
- Classical and quantum transport in focused-ion-beam-deposited Pt nanointerconnectsApplied Physics Letters, 2003
- Conductance quantization in magnetic nanowires electrodeposited in nanoporesApplied Physics Letters, 2002
- Silicon nanowires with sub 10 nm lateral dimensions: From atomic force microscope lithography based fabrication to electrical measurementsJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002
- Size and grain-boundary effects of a gold nanowire measured by conducting atomic force microscopyApplied Physics Letters, 2002
- Fabrication of gold nanowires on insulating substrates by field-induced mass transportApplied Physics Letters, 2001
- Electric-field assisted assembly and alignment of metallic nanowiresApplied Physics Letters, 2000