6. Ion Scattering and Secondary-Ion Mass Spectrometry
- 1 January 1985
- book chapter
- Published by Elsevier
- Vol. 22, 299-348
- https://doi.org/10.1016/s0076-695x(08)60320-8
Abstract
No abstract availableKeywords
This publication has 104 references indexed in Scilit:
- Ion beam induced desorption of surface layersNuclear Instruments and Methods, 1980
- The application of nuclear reactions for quantitative hydrogen analysis in a variety of different materials problemsNuclear Instruments and Methods, 1978
- Angular Dependence of Oscillatory Structure in Low-Energy Ion-Surface ScatteringPhysical Review Letters, 1976
- Multiple scattering of low energy rare gas ions: A comparison of experiment and computer simulationNuclear Instruments and Methods, 1976
- Low energy ion scattering: Elastic and inelastic effectsNuclear Instruments and Methods, 1976
- Charge exchange of low energy He ions and atoms scattered from a copper single crystalNuclear Instruments and Methods, 1976
- Surface Composition Analysis by Binary Scattering of Noble Gas IonsJournal of Vacuum Science and Technology, 1970
- Die Zerstäubung von Kupfer durch Ne+-, Ar+-, Kr+- und Xe+-Ionen im Energiebereich von 75keV bis 1MeVThe European Physical Journal A, 1966
- Sputtering of copper by bombardment with ions of 5–25 keVPhysica, 1960
- Zur Energieverteilung der von Protonen in Gasen ausgelösten SekundärelektronenThe European Physical Journal A, 1957