Characterization of tin in the bottom surface of float glass by ellipsometry and XPS
- 1 May 1980
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 38-39, 749-754
- https://doi.org/10.1016/0022-3093(80)90526-8
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The determination of surface composition profiles in glass by Auger electron spectroscopy and ion etchingJournal of Materials Science, 1977
- Penetration depth of tin in float glassJournal of Non-Crystalline Solids, 1977
- Chemical characteristics of float glass surfacesJournal of Non-Crystalline Solids, 1975
- X-ray photoelectron spectroscopy of glass in theory and experimentJournal of Non-Crystalline Solids, 1975
- Quantitative surface analysis by x-ray photoelectron spectroscopy (ESCA)Analytical Chemistry, 1975
- Ion Neutralization Processes at Insulator Surfaces and Consequent Impurity Migration Effects in SiFilmsPhysical Review Letters, 1973
- Auger lines in x-ray photoelectron spectrometryAnalytical Chemistry, 1972
- Electron Spectroscopy with Monochromatized X-raysScience, 1972