Energy dispersion quantitative X-ray microanalysis on a scanning electron microscope
- 1 July 1975
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 4 (3) , 99-107
- https://doi.org/10.1002/xrs.1300040304
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Ein Beitrag zur quantitativen Elektronen-strahlmikroanalyse von Phasen in polierten Anschliffen von Silikatproben mit dem Raster-Elektronemikroskop und energie-dispersiver Messung der RöntgenstrahlungX-Ray Spectrometry, 1974
- The evaluation of the use of a scanning electron microscope combined with an energy dispersive X-ray analyser for quantitative analysisX-Ray Spectrometry, 1973
- Quantitative electron microprobe analysis using a lithium drifted silicon detectorX-Ray Spectrometry, 1973
- Pulse pile-up rejection in Si(Li) X-ray detection systemsJournal of Physics E: Scientific Instruments, 1972
- Escape peaks and internal fluorescence in X-ray spectra recorded with lithium drifted silicon detectorsJournal of Physics E: Scientific Instruments, 1972