An improved single-line method for the wide-angle X-ray scattering profile analysis of polymers
- 31 July 1987
- Vol. 28 (8) , 1271-1276
- https://doi.org/10.1016/0032-3861(87)90436-8
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadeningJournal of Applied Crystallography, 1982
- Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysisAnalytical and Bioanalytical Chemistry, 1982
- An improved method for the determination of microstructural parameters by diffraction-profile Fourier analysisActa Crystallographica Section A, 1980
- Methode de separation des dimensions de domaine et des microdeformations a partir des coefficients de fourier d'un seul profil de raie de diffraction XActa Metallurgica, 1975
- The Fourier coefficients of paracrystalline X-ray diffractionActa Crystallographica Section A, 1971
- The separation of particle size and strain by the method of the varianceActa Crystallographica, 1966
- Variance as a Measure of Line BroadeningNature, 1962
- X-ray studies of deformed metalsProgress in Metal Physics, 1959
- The Separation of Cold-Work Distortion and Particle Size Broadening in X-Ray PatternsJournal of Applied Physics, 1952
- The Effect of Cold-Work Distortion on X-Ray PatternsJournal of Applied Physics, 1950