Determination of the critical thickness and the sensitivity for thin-film analysis by total reflection X-ray fluorescence spectrometry
- 1 January 1989
- journal article
- review article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 44 (5) , 461-469
- https://doi.org/10.1016/0584-8547(89)80051-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Quantification in total reflection X-ray fluorescence analysis of microtome sectionsSpectrochimica Acta Part B: Atomic Spectroscopy, 1989
- Microanalysis of solid samples by total-reflection x-ray fluorescence spectrometryAnalytical Chemistry, 1987
- Quantitative Microprobe Analysis of Thin Insulating FilmsPublished by Springer Nature ,1968