A novel method of interface exposure
- 2 May 1982
- journal article
- Published by Elsevier in Surface Science
- Vol. 117 (1-3) , 629-638
- https://doi.org/10.1016/0039-6028(82)90544-1
Abstract
No abstract availableKeywords
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Si ] ⩽ 1w o ) in carbon dioxideCorrosion Science, 1982 - A theoretical analysis of the oxidation of FeSi alloysCorrosion Science, 1982
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- Interface Formation during Thin Film DepositionJournal of Applied Physics, 1963