Determination of reduced thicknesses by means of the variable take-off angle technique
- 1 January 1981
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 22 (3) , 333-346
- https://doi.org/10.1016/0368-2048(81)85023-2
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Zur bestimmung der reduzierten dicke D/λ dünner Schichten mittels XPSJournal of Electron Spectroscopy and Related Phenomena, 1978
- Solid state—and surface—analysis by means oF angular-dependent x-ray photoelectron spectroscopyProgress in Solid State Chemistry, 1976
- Surface sensitivity and angular dependence of X-ray photoelectron spectraSurface Science, 1973