Determination of the reduced thickness of surface layers by means of the substrate method
- 31 December 1981
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 22 (2) , 157-172
- https://doi.org/10.1016/0368-2048(81)80024-2
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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