Zur bestimmung der reduzierten dicke D/λ dünner Schichten mittels XPS
- 31 December 1978
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 14 (4) , 287-322
- https://doi.org/10.1016/0368-2048(78)80005-x
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
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