Normal and lateral force investigation using magnetically activated force sensors
- 1 April 2000
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 157 (4) , 314-319
- https://doi.org/10.1016/s0169-4332(99)00545-0
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- Dynamic force microscopy by means of the phase-controlled oscillator methodJournal of Applied Physics, 1997
- Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7×7Physical Review B, 1996
- A new force controlled atomic force microscope for use in ultrahigh vacuumReview of Scientific Instruments, 1996
- Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force MicroscopyScience, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force MicroscopyJapanese Journal of Applied Physics, 1995
- A novel force microscope and point contact probeReview of Scientific Instruments, 1993
- Interaction force detection in scanning probe microscopy: Methods and applicationsJournal of Applied Physics, 1992
- Local electrical dissipation imaged by scanning force microscopyApplied Physics Letters, 1991
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991