Surface optical spectroscopy
- 1 November 1977
- journal article
- Published by IOP Publishing in Physics in Technology
- Vol. 8 (6) , 238-243
- https://doi.org/10.1088/0305-4624/8/6/i01
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Ellipsometric measurements on tantalum and tantalum oxide films and variation of the optical constants with structureThin Solid Films, 1977
- Ellipsometry and its applications to surface examinationJournal of Physics E: Scientific Instruments, 1973