Annealing studies of PbTe and Pb1−xSnxTe

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Abstract
The results of single-zone annealing of 76 samples of Pb1−xSnxTe are reported, covering the entire composition range from pure PbTe to pure SnTe. Some of the sample preparation work overlapped and improved on the work of others, while some of the results, particularly in the alloy samples, are new. Annealing times, temperatures, source ingot preparation, resulting carrier concentrations, and 77 °K Hall mobilities are reported. The Knight shift of the Pb207 nuclear magnetic resonance and the NMR line shape were used for additional sample characterization. This interesting technique was applied most successfully in the pure PbTe samples with carrier concentrations below 1018 cm−3. It was discovered from NMR studies on powders that strain damage introduced by powdering could completely compensate p-type PbTe. No corresponding effect was noted in n-type PbTe, suggesting the presence of damage-induced levels in the gap.

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