V. A two stage model for deep level capture
- 1 October 1977
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 36 (4) , 1021-1034
- https://doi.org/10.1080/14786437708239776
Abstract
It is argued that capture of a carrier into the ground state of a deep, charged trap will be preceded by capture into a shallow, excited state. The temperature dependences of capture and re-emission are worked out as consequences of this two step model. Predictions are compared with measurements on the hole trap in GaP at E T = E v + 0·75eV.Keywords
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