Thin film Ti⧸6H-SiC interfacial reaction: high spatial resolution electron microscopy study
- 31 December 1993
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 52 (3-4) , 289-296
- https://doi.org/10.1016/0304-3991(93)90038-y
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Heteroepitaxial Growih and Characterization of Titanium Films on Alpha (6H) Silicon CarbideMRS Proceedings, 1991
- Interfacial reactions in Ti/SiC layered films with and without thin diffusion barriersMaterials Science and Engineering: A, 1990
- Interaction between titanium and SiCJournal of Materials Science, 1990
- High-resolution electron microscopy of a SiC/SiC joint brazed by a Ag-Cu-Ti alloyJournal of Materials Science, 1988
- Bonding ofα-SiC basal planes to close-packed Ti, Cu, and Pt surfaces: Molecular-orbital theoryPhysical Review B, 1988
- Tem specimen heating during ion beam thinning: Microstructural instabilityUltramicroscopy, 1987
- Interaction of Ti with C- and SiC-contaminated Si surfacesJournal of Applied Physics, 1986
- Silicon carbide fibres and their potential for use in composite materials. Part IIComposites, 1984
- Digital image processing: The semper systemUltramicroscopy, 1979
- High-temperature compatibility between vapor-deposited SiC filaments and titaniumFibre Science and Technology, 1972