Tem specimen heating during ion beam thinning: Microstructural instability
- 31 December 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 21 (4) , 327-334
- https://doi.org/10.1016/0304-3991(87)90031-3
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Non-equilibrium phase distribution in an Al-SiC compositeMaterials Science and Engineering, 1985
- The preparation of cross‐section specimens for transmission electron microscopyJournal of Electron Microscopy Technique, 1984
- The Intergranular Phase in Hot‐Pressed Silicon Nitride: I, Elemental CompositionJournal of the American Ceramic Society, 1981
- Advances in Transmission Electron Microscope Techniques Applied to Device Failure AnalysisJournal of the Electrochemical Society, 1980
- A saddle field ion source of spherical configuration for etching and thinning applicationsVacuum, 1974
- Gold silicon phase diagramSolid-State Electronics, 1967