Characterization of transistor mismatch for statistical CAD of submicron CMOS analog circuits

Publisher Website

30 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iscas.1993.393994

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Statistical modeling of device mismatch for analog MOS integrated circuits
IEEE Journal of Solid-State Circuits, 1992
Matching properties of MOS transistors
IEEE Journal of Solid-State Circuits, 1989