Matching properties of MOS transistors
- 1 October 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 24 (5) , 1433-1439
- https://doi.org/10.1109/jssc.1989.572629
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- A CCD Delay Line for Video ApplicationsIEEE Transactions on Consumer Electronics, 1987
- Characterisation and modeling of mismatch in MOS transistors for precision analog designIEEE Journal of Solid-State Circuits, 1986
- Random error effects in matched MOS capacitors and current sourcesIEEE Journal of Solid-State Circuits, 1984
- Introduction to Robust and Quasi-Robust Statistical MethodsPublished by Springer Nature ,1983
- Random errors in MOS capacitorsIEEE Journal of Solid-State Circuits, 1982
- Monolithic expandable 6 bit 20 MHz CMOS/SOS A/D converterIEEE Journal of Solid-State Circuits, 1979