Characterisation and modeling of mismatch in MOS transistors for precision analog design

This publication has 15 references indexed in Scilit:

• Random error effects in matched MOS capacitors and current sources
  IEEE Journal of Solid-State Circuits, 1984
• High-precision MOS current mirror
  IEE Proceedings I Solid State and Electron Devices, 1984
• Random errors in MOS capacitors
  IEEE Journal of Solid-State Circuits, 1982
• Matching properties, and voltage and temperature dependence of MOS capacitors
  IEEE Journal of Solid-State Circuits, 1981
• Electron Mobility in Inversion and Accumulation Layers on Thermally Oxidized Silicon Surfaces
  IEEE Journal of Solid-State Circuits, 1980
• Generalized guide for MOSFET miniaturization
  IEEE Electron Device Letters, 1980
• Potential of MOS technologies for analog integrated circuits
  IEEE Journal of Solid-State Circuits, 1978
• Sampled analog filtering using switched capacitors as resistor equivalents
  IEEE Journal of Solid-State Circuits, 1977
• MOS sampled data recursive filters using switched capacitor integrators
  IEEE Journal of Solid-State Circuits, 1977
• Statistical Circuit Design: Characterization and Modeling for Statistical Design
  Bell System Technical Journal, 1971