Statistical Circuit Design: Characterization and Modeling for Statistical Design
- 1 April 1971
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 50 (4) , 1105-1147
- https://doi.org/10.1002/j.1538-7305.1971.tb02547.x
Abstract
Analysis of the variation in the electrical performance of integrated circuit structures requires a knowledge of the distributions and inter-relationships of device parameter values. This article presents new techniques for more accurate transistor m...Keywords
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