RANDOM TESTING OF THE DATA PROCESSING SECTION OF A MICROPROCESSOR
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Random testing of integrated circuitsIEEE Transactions on Instrumentation and Measurement, 1981
- Minimal Detecting Transition Sequences: Application to Random TestingIEEE Transactions on Computers, 1980
- The Error Latency of a Fault in a Sequential Digital CircuitIEEE Transactions on Computers, 1976
- Can a User Test LSI Microprocessors Effectively?IEEE Transactions on Manufacturing Technology, 1976