Quantitative Bestimmung der Zusammensetzung von Ga1−xAlxAs‐Epitaxieschichten mit der Elektronenstrahl‐Mikroanalyse (ESMA)
- 1 January 1974
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 9 (3) , 227-236
- https://doi.org/10.1002/crat.19740090306
Abstract
No abstract availableKeywords
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