Etat actuel des méthodes quantitatives d’analyse par sonde électronique
- 1 January 1969
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Electron scattering in thick targetsBritish Journal of Applied Physics, 1967
- An Electron Transport Model for the Prediction of X-Ray Production and Electron Backscattering in Electron MicroanalysisJournal of Applied Physics, 1966
- Characteristic fluorescence corrections in electron-probe microanalysisBritish Journal of Applied Physics, 1965
- An Empirical Method for Electron Microanalysis.Analytical Chemistry, 1964
- A Monte Carlo Calculation of the Spatial Distribution of Characteristic X-ray Production in a Solid TargetProceedings of the Physical Society, 1963
- The Effect of Atomic Number in X-Ray MicroanalysisPublished by Elsevier ,1963