Ultrahigh vacuum scanning force/scanning tunneling microscope: Application to high-resolution imaging of Si(111)7×7
- 1 June 1996
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 67 (6) , 2289-2296
- https://doi.org/10.1063/1.1146935
Abstract
No abstract availableKeywords
This publication has 30 references indexed in Scilit:
- Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuumReview of Scientific Instruments, 1994
- Ultrahigh vacuum atomic force microscope with sample cleaving mechanismJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- Ultrahigh vacuum atomic force microscope using a pantograph inchworm mechanismReview of Scientific Instruments, 1993
- Development of an ultrahigh vacuum atomic force microscope for investigations of semiconductor surfacesJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1993
- Atomic Force Microscopy and X‐ray Photoelectron Spectroscopy Investigation of the Onset of Reactions on Alkali Silicate Glass SurfacesJournal of the American Ceramic Society, 1993
- A low-temperature atomic force/scanning tunneling microscope for ultrahigh vacuumJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Force microscopy with a bidirectional capacitance sensorReview of Scientific Instruments, 1990
- Optical-beam-deflection atomic force microscopy: The NaCl (001) surfaceApplied Physics Letters, 1990
- Atomic Force MicroscopePhysical Review Letters, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982