The Synthesis of X-Ray Spectrometer Line Profiles with Application to Crystallite Size Measurements
- 1 February 1954
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 25 (2) , 155-161
- https://doi.org/10.1063/1.1721595
Abstract
An improved convolutional method is used to synthesize theoretical line profiles generated by the joint action of seven instrumental weight functions characteristic of the x‐ray spectrometer. These include in addition to the five geometrical factors described in a previous publication: (VI) a so‐called misalignment function and (VII) a spectral impurity function. The method is applied to the new spectrometer design incorporating a narrow x‐ray source, Soller slits, and an angular range 2θ=0 to 165° or higher. Good agreement between theoretical and experimental line profiles is achieved for quartz reflections at 2θ=24.0 and 90.7°. The improved treatment is used to define new curves for correcting experimental spectrometer line breadths for instrumental broadening effects. It is demonstrated that spectrometers of the new design are capable of measuring crystallite dimensions as large as 3000A.This publication has 10 references indexed in Scilit:
- The effect of vertical divergence on X-ray powder diffraction linesBritish Journal of Applied Physics, 1953
- Effect of vertical divergence on the displacement and breadth of X-ray powder diffraction linesBritish Journal of Applied Physics, 1952
- Influence of the Apparatus Function on Crystallite Size Determinations with Geiger Counter SpectrometersProceedings of the Physical Society. Section B, 1952
- Determination of Crystallite Size with the X-Ray SpectrometerJournal of Applied Physics, 1950
- Geometrical Factors Affecting the Contours of X-Ray Spectrometer Maxima. II. Factors Causing BroadeningJournal of Applied Physics, 1950
- Discussion of ``Geometrical Factors Affecting X-Ray Spectrometer Maxima''Journal of Applied Physics, 1949
- Limits of accuracy in the determination of lattice parameters and stresses by the Debye–Scherrer methodActa Crystallographica, 1949
- Geometrical Factors Affecting the Contours of X-Ray Spectrometer Maxima. I. Factors Causing AsymmetryJournal of Applied Physics, 1948
- An X-Ray Study of the Changes that Occur in Malleable Iron During the Process of FatiguingPhysical Review B, 1939
- The measurement of particle size by the X-ray methodProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1938