Effect of vertical divergence on the displacement and breadth of X-ray powder diffraction lines
- 1 November 1952
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 3 (11) , 349-352
- https://doi.org/10.1088/0508-3443/3/11/303
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction MaximaJournal of Scientific Instruments, 1950
- The Lattice-Parameters of Clear Crystalline QuartzProceedings of the Physical Society. Section B, 1950
- Geometrical Factors Affecting the Contours of X-Ray Spectrometer Maxima. II. Factors Causing BroadeningJournal of Applied Physics, 1950
- X-Ray Powder Diffraction Analysis Film and Geiger Counter TechniquesScience, 1949
- Discussion of ``Geometrical Factors Affecting X-Ray Spectrometer Maxima''Journal of Applied Physics, 1949
- Geometrical Factors Affecting the Contours of X-Ray Spectrometer Maxima. I. Factors Causing AsymmetryJournal of Applied Physics, 1948
- Parafocusing Properties of Microcrystalline Powder Layers in X-Ray Diffraction Applied to the Design of X-Ray GoniometersJournal of Applied Physics, 1946
- The derivation of lattice spacings from Debye-Scherrer photographsJournal of Scientific Instruments, 1941
- A method for deducing accurate values of the lattice spacing from X-ray powder photographs taken by the Debye-Scherrer methodProceedings of the Physical Society, 1932
- A New Precision X-ray SpectrometerPhysical Review B, 1924