Real-time X-ray diffraction using synchrotron radiation: System characterization and applications
- 15 April 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 208 (1-3) , 495-510
- https://doi.org/10.1016/0167-5087(83)91173-0
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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