WTPGA: a novel weighted test-pattern generation approach for VLSI built-in self test
- 6 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 256-262
- https://doi.org/10.1109/test.1988.207810
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- On Random Pattern Test LengthIEEE Transactions on Computers, 1984
- Random Pattern TestabilityIEEE Transactions on Computers, 1984
- The Weighted Random Test-Pattern GeneratorIEEE Transactions on Computers, 1975