Explanation of Contrast Effects in Synchrotron X-Ray Topographs of Bent Crystals by Means of Multiple Diffraction
- 16 February 1982
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 69 (2) , 687-697
- https://doi.org/10.1002/pssa.2210690231
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Multiple diffraction lines in the synchrotron x-ray topographs of elastically bent silicon single crystalsPhysical Review B, 1981
- Quasi-lifetime topography of magnetic domain movements in grain oriented (100) [001] FE–3 wt% Si polycrystals using white synchrotron radiation. II. The influence of small tensile stressPhysica Status Solidi (a), 1979
- Pendellösung Fringes in Synchrotron X-Ray Topographs of a Wedge-Shaped Silicon CrystalPhysica Status Solidi (a), 1978
- Synchrotron radiation topographic evidence for the interaction of plane-polarized X-ray photons with perfect crystalsPhysica Status Solidi (a), 1977
- Observations on Equal-Inclination Interference Fringes from a Thin Crystal of Silicon Using Nearly Parallel X-Ray BeamJournal of the Physics Society Japan, 1971
- Messungen zur Röntgenstrahl-Optik des Idealkristalls. II. Diffraction Pattern mit `Pendellösung' gleicher NeigungActa Crystallographica Section A, 1968
- Multiple diffraction in imperfect crystalsActa Crystallographica, 1965
- The effects of simultaneous reflections on single-crystal neutron diffraction intensitiesActa Crystallographica, 1964
- A study of pendellösung fringes in X-ray diffractionActa Crystallographica, 1959
- ?Umweganregung?, eine bisher unbeachtete Wechselwirkungserscheinung bei RaumgitterinterferenzenThe European Physical Journal A, 1937