The inelastic contribution to high resolution images of defects
- 30 September 1990
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 33 (3) , 177-185
- https://doi.org/10.1016/0304-3991(90)90110-8
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- The contribution of inelastically scattered electrons to high resolution [110] images of AlAs/GaAs heterostructuresUltramicroscopy, 1989
- The contribution of inelastically scattered electrons to high resolution images of (Al, Ga)As/GaAs heterostructuresUltramicroscopy, 1988
- EMS - a software package for electron diffraction analysis and HREM image simulation in materials scienceUltramicroscopy, 1987
- Theory of Image Formation by Inelastically Scattered Electrons in the Electron MicroscopePublished by Elsevier ,1985
- Atomic structure of [011] and [001] near-coincident tilt boundaries in germanium and siliconPhilosophical Magazine A, 1984
- Image formation by inelastically scattered electrons: Image of a surface plasmonUltramicroscopy, 1983
- Lattice imaging of a grain boundary in crystalline germaniumPhilosophical Magazine, 1977
- Multi-beam lattice images from germanium oriented in (011)Philosophical Magazine, 1977
- The determination of foil thickness by scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- Electron microscopy of plasmonsPhilosophical Magazine, 1974