The contribution of inelastically scattered electrons to high resolution images of (Al, Ga)As/GaAs heterostructures
- 31 December 1988
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 26 (4) , 361-376
- https://doi.org/10.1016/0304-3991(88)90235-5
Abstract
No abstract availableKeywords
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