Image Calculations in High-Resolution Electron Microscopy: Problems, Progress, and Prospects
- 1 January 1985
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 59 references indexed in Scilit:
- High Resolution Images for Large Cell Crystals Exhibiting Some Limits of the Projected Potential ApproximationPhysica Status Solidi (a), 1984
- Time-like perturbation method in high-energy electron diffractionActa Crystallographica Section A Foundations of Crystallography, 1983
- Observations on the real space computation of dynamical electron diffraction intensitiesJournal of Microscopy, 1982
- High Resolution Electron Microscopic and Electron Diffraction Study of the Au-Mg System. I. The Monoclinic Au15Mg4 PhasePhysica Status Solidi (a), 1979
- Direct observation by high resolution electron microscopy of coincidence sites in domain boundaries in ordered gold-manganese alloysPhysica Status Solidi (a), 1978
- The calculation of electron diffraction intensities by the multislice methodActa Crystallographica Section A, 1977
- The Critical Voltage Effect in Transmission Electron Microscopy. I. Eigenvalue Degeneracy in the Three-Beam CasePhysica Status Solidi (b), 1974
- The Calculation of Electron Diffraction IntensitiesProceedings of the Physical Society, 1962
- Fourier Images: I - The Point SourceProceedings of the Physical Society. Section B, 1957
- Die Amplituden der Wellenfelder bei Elektroneninterferenzen imLaue-FallThe European Physical Journal A, 1955