Reliability of 2-dimensional consecutive-k-out-of-n:F systems
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 42 (4) , 658-661
- https://doi.org/10.1109/24.273602
Abstract
The authors derive lower and upper reliability bounds for the two-dimensional consecutive k-out-of-n:F system (Salvia Lasher, 1990) with independent, but not necessarily identically distributed, components. A Weibull limit theory is proven for system time-to-failure for i.i.d. componentKeywords
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