Automated structure factor refinement from convergent-beam patterns

This publication has 25 references indexed in Scilit:

• On differentiation of the scattering matrix in dynamical transmission electron diffraction
  Acta Crystallographica Section A Foundations of Crystallography, 1990
• Absorptive form factors for high-energy electron diffraction
  Acta Crystallographica Section A Foundations of Crystallography, 1990
• Comment on ‘‘Accurate structure-factor phase determination by electron diffraction in noncentrosymmetric crystals’’
  Physical Review Letters, 1989
• On the breakdown of Friedel's law in electron backscattering channelling patterns
  Acta Crystallographica Section A Foundations of Crystallography, 1988
• A Summary of Low-angle X-ray Atomic Scattering Factors Measured by the Critical Voltage Effect in High Energy Electron Diffraction
  Australian Journal of Physics, 1988
• Direct measurement of crystallographic phase by electron diffraction
  Physical Review Letters, 1987
• The critical-voltage effect in convergent-beam high-voltage electron diffraction
  Acta Crystallographica Section A, 1980
• The scattering of fast electrons by crystals
  Reports on Progress in Physics, 1979
• Determination of structure factors of germanium by the critical-voltage and convergent-beam diffraction methods
  Physica Status Solidi (a), 1976
• Examination of the graphite structure by convergent-beam electron diffraction
  Acta Crystallographica Section A, 1976