A stage for submicron displacements using electromagnetic coils and its application to scanning tunneling microscopy
- 1 March 1991
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 62 (3) , 830-831
- https://doi.org/10.1063/1.1142042
Abstract
Coarse motion mechanisms have proven essential for STM investigations. The new system that we have built and that is presented here uses electromagnetic forces to clamp the feet of the ‘‘louse.’’ These forces arise from a current that flows through three electromagnetic coils. This system, fully computer automated, is found to give reliable approaches and allows lateral displacements of the sample with variable step sizes and hence, can also be used in other specific applications that require nanodisplacements.Keywords
This publication has 7 references indexed in Scilit:
- Scanning tunneling microscopy of defects induced by carbon bombardment on graphite surfacesSurface Science, 1990
- The use of a linear piezoelectric actuator for coarse motion in a vacuum compatible scanning tunneling microscopeJournal of Vacuum Science & Technology A, 1989
- A scanning tunneling microscope based on a motorized micrometerReview of Scientific Instruments, 1989
- Compact, high-stability, ‘‘thimble-size’’ scanning tunneling microscopeReview of Scientific Instruments, 1988
- Scanning tunneling microscope combined with a scanning electron microscopeReview of Scientific Instruments, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982
- Tunneling through a controllable vacuum gapApplied Physics Letters, 1982