Four point probe Hall effect and resistivity measurements upon semiconductors
- 31 May 1972
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 15 (5) , 577-585
- https://doi.org/10.1016/0038-1101(72)90159-1
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- The evaluation of geometrical effects in four point probe measurementsSolid-State Electronics, 1971
- A hall four-point probe on thin plates: Theory and experimentSolid-State Electronics, 1967
- The application of the relaxation method to the calculation of the potential distribution of Hall platesSolid-State Electronics, 1966
- Magnetoconductive correction factors for an isotropic Hall plate with point sourcesSolid-State Electronics, 1966
- HALL MEASUREMENTS USING CORBINO-LIKE CURRENT SOURCES IN THIN CIRCULAR DISKSApplied Physics Letters, 1964
- Semiconductor sheet resistivity measurements on square samplesJournal of Scientific Instruments, 1964