Semiconductor sheet resistivity measurements on square samples

This publication has 4 references indexed in Scilit:

• The geometric factor in semiconductor four-probe resistivity measurements
  Solid-State Electronics, 1963
• Four-probe resistivity measurements on small circular specimens
  British Journal of Applied Physics, 1961
• Measurement of the Sheet Resistivity of a Square Wafer with a Square Four-Point Probe
  Review of Scientific Instruments, 1960
• The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor Engineering
  Bell System Technical Journal, 1955