Microhardness of Ti-N films containing the epsilon -Ti2N phase
- 14 November 1988
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 21 (11) , 1657-1658
- https://doi.org/10.1088/0022-3727/21/11/020
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Structural Investigation of Ti-N FilmsMRS Proceedings, 1985