Band-offset determination of the CdTe/(Cd,Mn)Te interface
- 15 January 1997
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 55 (3) , 1724-1729
- https://doi.org/10.1103/physrevb.55.1724
Abstract
We report on photoluminescence excitation spectroscopy of CdTe/(Cd,Mn)Te separate confinement heterostructures. The Mn concentration and layers thicknesses are carefully chosen, so that transitions that are strongly dependent on the valence-band offset are observable. Comparison between theory and experiments gives a valence-band offset between CdTe and Te equal to 25% ± 7% of the total band-gap difference.
Keywords
This publication has 40 references indexed in Scilit:
- Magnetic tailoring of the nature of the fundamental optical transition in a ZnSe/(Zn,Mn)Se heterostructurePhysical Review B, 1994
- Magneto-optical study of heavy- and light-hole excitons in CdTe/(Cd,Mn)Te single quantum wellsSemiconductor Science and Technology, 1993
- Optical study of the piezoelectric field effect in (1 1 1)-oriented CdTe/CdMnTe strained quantum wellsPhysica B: Condensed Matter, 1993
- Magnetic-field-induced type-I→type-II transition in a semimagnetic CdTe/Te superlatticePhysical Review B, 1990
- Band offset determination in CdTe/Cd1−xMnxe MQWs grown on InSb substratesSurface Science, 1990
- Spin-dependent type-I, type-II behavior in a quantum well systemPhysical Review Letters, 1989
- Band offsets and excitons in CdTe/(Cd,Mn)Te quantum wellsPhysical Review B, 1988
- Summary Abstract: Failure of the common anion rule for lattice-matched heterojunctionsJournal of Vacuum Science & Technology B, 1986
- Synchrotron radiation study ofTe (0≤x≤0.65)Physical Review B, 1986
- Growth of Cd1−xMnxTe films with 0<x<0.9 by atomic layer epitaxyApplied Physics Letters, 1984